Website:
jobcrexa.com
Job details:
20 Gbps) 99% stuck-at, transition, path delay fault coverage)
- Develop and integrate scan insertion flows for large digital subsystems — including full-scan, partial-scan, and scan compression (X-Bounding, EDT, TK-Scan)
- Implement Memory Built-In Self-Test (MBIST) for embedded SRAMs, ROMs, and register files within the So C
- Design and implement Logic BIST (LBIST) infrastructure for in-system and in-field diagnostic test capabilities — critical for automotive functional safety (ISO 26262)
- Develop ATE test programs and ATPG patterns for manufacturing test on Advantest / Teradyne platforms, optimizing for test time and coverage
- Implement IEEE 1687 (i JTAG) network for embedded instrument access and hierarchical test access across complex So C subsystems
- Collaborate with analog design teams to define testability solutions for mixed-signal blocks — including DAC/ADC test modes, PLL characterization modes, and Ser Des loopback
- Partner with physical design teams to ensure DFT-aware floorplanning, scan routing, and test clock tree implementation
- Drive DFT sign-off — validating ATPG coverage, test pattern simulation, and correlation between simulation and ATE results
✅ Required Qualifications
- Education: B. Tech / M. Tech in VLSI / Electronics / Computer Engineering
- Experience: 3–10 years of DFT engineering experience on complex digital or mixed-signal So Cs
- Strong expertise in scan insertion and scan compression (Synopsys DFT Compiler, Mentor DFTADVISOR, or equivalent)
- Proficiency in ATPG pattern generation and fault simulation (Synopsys Tetra MAX, Cadence Modus, or equivalent)
- Experience with MBIST implementation and verification for embedded memories
- Working knowledge of JTAG (IEEE 1149.1) and boundary scan methodologies
- Understanding of ATE test program development (Advantest 93 K, Teradyne Ultra FLEX preferred)
- Familiarity with automotive DFT quality standards (zero-defect, PPM targets, AEC-Q100)
Preferred / Good-to-Have Skills
- Experience with LBIST implementation for automotive functional safety (ISO 26262 ASIL-B/D)
- Knowledge of IEEE 1687 (i JTAG) for embedded instrument access
- Background in mixed-signal DFT — analog test modes, loopback testing, SERDES BIST
- Familiarity with test compression techniques (EDT, Tessent Streaming Scan Network)
- Experience with in-system test and diagnosis for automotive field applications
- Exposure to advanced node DFT challenges (Fin FET, cell-aware fault models)
What Makes This Role Unique
️ Quality Guardian Your DFT directly ensures zero-defect automotive silicon at scale
Automotive Criticality DFT decisions protect functional safety in vehicles globally
Full Lifecycle Impact DFT architecture → ATE patterns → Manufacturing yield
Cross-Domain Collaboration Work with analog, digital, physical design & silicon validation
Global Manufacturing Scale Your test solutions run on production ATE for global automotive
Career Growth High-value specialization at the intersection of design and manufacturing
Click on Apply to know more.
